Evidence-Based Guidelines to Defect Causal Analysis
Applying DPPI: A Defect Causal Analysis Approach Using Bayesian Networks
Towards a Defect Prevention Based Process Improvement Approach
Lecture Notes in Computer Science
IEEE Software
2008 34th Euromicro Conference Software Engineering and Advanced Applications
Guilherme Horta Travassos
Marcos Kalinowski
Emília Mendes