Software Testing in Critical Embedded Systems: a Systematic Review of Adherence to the DO-178B Standard

BARBOSA, J. R. ; Maldonado, J.C. ; DELAMARO, MARCIO EDUARDO ; VINCENZI, A. M. R. . Software Testing in Critical Embedded Systems: a Systematic Review of Adherence to the DO-178B Standard. In: International Conference on Advances in System Testing and Validation Lifecycle - VALID, 2011, Barcelona, Espanha. III International Conference on Advances in System Testing and Validation Lifecycle - VALID'2011, 2011.

2011