Kernel vulnerability factor and efficient hardening for histogram of oriented gradients
Radiation-Induced Error Criticality in Modern HPC Parallel Accelerators
Evaluation of Histogram of Oriented Gradients Soft Errors Criticality for Automotive Applications
2017 IEEE International Symposium on High Performance Computer Architecture (HPCA)
2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
ACM Transactions on Architecture and Code Optimization
Philippe Olivier Alexandre Navaux
Paolo Rech
Philippe Navaux
Luigi Carro
Lucas Weigel
Mauricio Hanzich